High-resolution type super sharp probe for AFM/SPM
AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.
This is a probe for atomic force microscopy and scanning probe microscopy. We offer two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm. - Super Sharp DLC Probe: A probe equipped with a DLC tip at the tip's end that has a curvature radius of less than about 3 nm. Due to the DLC, it boasts high durability and long lifespan. - Super Sharp SS Probe: A probe with the tip's end sharpened to a curvature radius of about 2 nm.
- Company：MSHシステムズ
- Price：Other
